GaN Selective Epitaxy in Sub-Micron Windows with Different Depths Formed by Ion Beam Nanolithography


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Resumo

A significant difference in the growth mechanism of spatially closed structures of gallium nitride during selective growth in submicron windows with and without penetration into the GaN sublayer was demonstrated. The mechanisms of generation and development of dislocations, their role in the formation of self-organizing coaxial structures were modeled.

Sobre autores

S. Rodin

Ioffe Institute

Autor responsável pela correspondência
Email: s_rodin77@mail.ru
Rússia, St. Petersburg

W. Lundin

Ioffe Institute

Email: s_rodin77@mail.ru
Rússia, St. Petersburg

A. Tsatsulnikov

Research and Engineering Center on Submicron Heterostructures for Microelectronics,
Russian Academy of Sciences

Email: s_rodin77@mail.ru
Rússia, St. Petersburg

A. Sakharov

Ioffe Institute

Email: s_rodin77@mail.ru
Rússia, St. Petersburg

S. Usov

Research and Engineering Center on Submicron Heterostructures for Microelectronics,
Russian Academy of Sciences

Email: s_rodin77@mail.ru
Rússia, St. Petersburg

M. Mitrofanov

Ioffe Institute

Email: s_rodin77@mail.ru
Rússia, St. Petersburg

I. Levitskii

Ioffe Institute

Email: s_rodin77@mail.ru
Rússia, St. Petersburg

V. Evtikhiev

Ioffe Institute

Email: s_rodin77@mail.ru
Rússia, St. Petersburg

M. Kaliteevski

ITMO University

Email: s_rodin77@mail.ru
Rússia, St. Petersburg

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