GaN Selective Epitaxy in Sub-Micron Windows with Different Depths Formed by Ion Beam Nanolithography
- Autores: Rodin S.N.1, Lundin W.V.1, Tsatsulnikov A.F.2, Sakharov A.V.1, Usov S.O.2, Mitrofanov M.I.1, Levitskii I.V.1, Evtikhiev V.P.1, Kaliteevski M.A.3
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Afiliações:
- Ioffe Institute
- Research and Engineering Center on Submicron Heterostructures for Microelectronics, Russian Academy of Sciences
- ITMO University
- Edição: Volume 61, Nº 12 (2019)
- Páginas: 2335-2337
- Seção: Semiconductors
- URL: https://ogarev-online.ru/1063-7834/article/view/206858
- DOI: https://doi.org/10.1134/S106378341912045X
- ID: 206858
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Resumo
A significant difference in the growth mechanism of spatially closed structures of gallium nitride during selective growth in submicron windows with and without penetration into the GaN sublayer was demonstrated. The mechanisms of generation and development of dislocations, their role in the formation of self-organizing coaxial structures were modeled.
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Sobre autores
S. Rodin
Ioffe Institute
Autor responsável pela correspondência
Email: s_rodin77@mail.ru
Rússia, St. Petersburg
W. Lundin
Ioffe Institute
Email: s_rodin77@mail.ru
Rússia, St. Petersburg
A. Tsatsulnikov
Research and Engineering Center on Submicron Heterostructures for Microelectronics,Russian Academy of Sciences
Email: s_rodin77@mail.ru
Rússia, St. Petersburg
A. Sakharov
Ioffe Institute
Email: s_rodin77@mail.ru
Rússia, St. Petersburg
S. Usov
Research and Engineering Center on Submicron Heterostructures for Microelectronics,Russian Academy of Sciences
Email: s_rodin77@mail.ru
Rússia, St. Petersburg
M. Mitrofanov
Ioffe Institute
Email: s_rodin77@mail.ru
Rússia, St. Petersburg
I. Levitskii
Ioffe Institute
Email: s_rodin77@mail.ru
Rússia, St. Petersburg
V. Evtikhiev
Ioffe Institute
Email: s_rodin77@mail.ru
Rússia, St. Petersburg
M. Kaliteevski
ITMO University
Email: s_rodin77@mail.ru
Rússia, St. Petersburg
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