GaN Selective Epitaxy in Sub-Micron Windows with Different Depths Formed by Ion Beam Nanolithography
- Авторы: Rodin S.N.1, Lundin W.V.1, Tsatsulnikov A.F.2, Sakharov A.V.1, Usov S.O.2, Mitrofanov M.I.1, Levitskii I.V.1, Evtikhiev V.P.1, Kaliteevski M.A.3
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Учреждения:
- Ioffe Institute
- Research and Engineering Center on Submicron Heterostructures for Microelectronics, Russian Academy of Sciences
- ITMO University
- Выпуск: Том 61, № 12 (2019)
- Страницы: 2335-2337
- Раздел: Semiconductors
- URL: https://ogarev-online.ru/1063-7834/article/view/206858
- DOI: https://doi.org/10.1134/S106378341912045X
- ID: 206858
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Аннотация
A significant difference in the growth mechanism of spatially closed structures of gallium nitride during selective growth in submicron windows with and without penetration into the GaN sublayer was demonstrated. The mechanisms of generation and development of dislocations, their role in the formation of self-organizing coaxial structures were modeled.
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Об авторах
S. Rodin
Ioffe Institute
Автор, ответственный за переписку.
Email: s_rodin77@mail.ru
Россия, St. Petersburg
W. Lundin
Ioffe Institute
Email: s_rodin77@mail.ru
Россия, St. Petersburg
A. Tsatsulnikov
Research and Engineering Center on Submicron Heterostructures for Microelectronics,Russian Academy of Sciences
Email: s_rodin77@mail.ru
Россия, St. Petersburg
A. Sakharov
Ioffe Institute
Email: s_rodin77@mail.ru
Россия, St. Petersburg
S. Usov
Research and Engineering Center on Submicron Heterostructures for Microelectronics,Russian Academy of Sciences
Email: s_rodin77@mail.ru
Россия, St. Petersburg
M. Mitrofanov
Ioffe Institute
Email: s_rodin77@mail.ru
Россия, St. Petersburg
I. Levitskii
Ioffe Institute
Email: s_rodin77@mail.ru
Россия, St. Petersburg
V. Evtikhiev
Ioffe Institute
Email: s_rodin77@mail.ru
Россия, St. Petersburg
M. Kaliteevski
ITMO University
Email: s_rodin77@mail.ru
Россия, St. Petersburg
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