Spin-Wave Resonance in Chemically Deposited Fe-Ni Films: Measuring the Spin-Wave Stiffness and Surface Anisotropy Constant


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Single-layer FexNi1 - x thin magnetic films have been investigated by the spin-wave resonance technique in the entire concentration range. The surface anisotropy and exchange stiffness constants for the films with a Ni content from 30 to 80 at % have been measured from the experimental standing spin wave spectra. The surface exchange spin wave penetration depth δC = 20–30 nm has been determined from the dependences of the surface anisotropy and exchange coupling constants on the Fe20Ni80 film thickness in the range of 250–400 nm.

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I. Vazhenina

Kirensky Institute of Physics

编辑信件的主要联系方式.
Email: irina-vazhenina@mail.ru
俄罗斯联邦, Krasnoyarsk, 660036

R. Iskhakov

Kirensky Institute of Physics

Email: irina-vazhenina@mail.ru
俄罗斯联邦, Krasnoyarsk, 660036

L. Chekanova

Kirensky Institute of Physics

Email: irina-vazhenina@mail.ru
俄罗斯联邦, Krasnoyarsk, 660036

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