Spin-Wave Resonance in Chemically Deposited Fe-Ni Films: Measuring the Spin-Wave Stiffness and Surface Anisotropy Constant
- 作者: Vazhenina I.G.1, Iskhakov R.S.1, Chekanova L.A.1
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隶属关系:
- Kirensky Institute of Physics
- 期: 卷 60, 编号 2 (2018)
- 页面: 292-298
- 栏目: Magnetism
- URL: https://ogarev-online.ru/1063-7834/article/view/202055
- DOI: https://doi.org/10.1134/S1063783418020294
- ID: 202055
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详细
Single-layer FexNi1 - x thin magnetic films have been investigated by the spin-wave resonance technique in the entire concentration range. The surface anisotropy and exchange stiffness constants for the films with a Ni content from 30 to 80 at % have been measured from the experimental standing spin wave spectra. The surface exchange spin wave penetration depth δC = 20–30 nm has been determined from the dependences of the surface anisotropy and exchange coupling constants on the Fe20Ni80 film thickness in the range of 250–400 nm.
作者简介
I. Vazhenina
Kirensky Institute of Physics
编辑信件的主要联系方式.
Email: irina-vazhenina@mail.ru
俄罗斯联邦, Krasnoyarsk, 660036
R. Iskhakov
Kirensky Institute of Physics
Email: irina-vazhenina@mail.ru
俄罗斯联邦, Krasnoyarsk, 660036
L. Chekanova
Kirensky Institute of Physics
Email: irina-vazhenina@mail.ru
俄罗斯联邦, Krasnoyarsk, 660036
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