Spin-Wave Resonance in Chemically Deposited Fe-Ni Films: Measuring the Spin-Wave Stiffness and Surface Anisotropy Constant
- Autores: Vazhenina I.G.1, Iskhakov R.S.1, Chekanova L.A.1
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Afiliações:
- Kirensky Institute of Physics
- Edição: Volume 60, Nº 2 (2018)
- Páginas: 292-298
- Seção: Magnetism
- URL: https://ogarev-online.ru/1063-7834/article/view/202055
- DOI: https://doi.org/10.1134/S1063783418020294
- ID: 202055
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Resumo
Single-layer FexNi1 - x thin magnetic films have been investigated by the spin-wave resonance technique in the entire concentration range. The surface anisotropy and exchange stiffness constants for the films with a Ni content from 30 to 80 at % have been measured from the experimental standing spin wave spectra. The surface exchange spin wave penetration depth δC = 20–30 nm has been determined from the dependences of the surface anisotropy and exchange coupling constants on the Fe20Ni80 film thickness in the range of 250–400 nm.
Sobre autores
I. Vazhenina
Kirensky Institute of Physics
Autor responsável pela correspondência
Email: irina-vazhenina@mail.ru
Rússia, Krasnoyarsk, 660036
R. Iskhakov
Kirensky Institute of Physics
Email: irina-vazhenina@mail.ru
Rússia, Krasnoyarsk, 660036
L. Chekanova
Kirensky Institute of Physics
Email: irina-vazhenina@mail.ru
Rússia, Krasnoyarsk, 660036
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