Spin-Wave Resonance in Chemically Deposited Fe-Ni Films: Measuring the Spin-Wave Stiffness and Surface Anisotropy Constant
- Авторлар: Vazhenina I.G.1, Iskhakov R.S.1, Chekanova L.A.1
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Мекемелер:
- Kirensky Institute of Physics
- Шығарылым: Том 60, № 2 (2018)
- Беттер: 292-298
- Бөлім: Magnetism
- URL: https://ogarev-online.ru/1063-7834/article/view/202055
- DOI: https://doi.org/10.1134/S1063783418020294
- ID: 202055
Дәйексөз келтіру
Аннотация
Single-layer FexNi1 - x thin magnetic films have been investigated by the spin-wave resonance technique in the entire concentration range. The surface anisotropy and exchange stiffness constants for the films with a Ni content from 30 to 80 at % have been measured from the experimental standing spin wave spectra. The surface exchange spin wave penetration depth δC = 20–30 nm has been determined from the dependences of the surface anisotropy and exchange coupling constants on the Fe20Ni80 film thickness in the range of 250–400 nm.
Авторлар туралы
I. Vazhenina
Kirensky Institute of Physics
Хат алмасуға жауапты Автор.
Email: irina-vazhenina@mail.ru
Ресей, Krasnoyarsk, 660036
R. Iskhakov
Kirensky Institute of Physics
Email: irina-vazhenina@mail.ru
Ресей, Krasnoyarsk, 660036
L. Chekanova
Kirensky Institute of Physics
Email: irina-vazhenina@mail.ru
Ресей, Krasnoyarsk, 660036
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