Dependence of the conductivity on the active-region thickness in GaAs thin-film Schottky diodes
- 作者: Zuev S.A.1, Kilessa G.V.1, Asanov E.E.1, Starostenko V.V.1, Pokrova S.V.1
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隶属关系:
- Vernadsky Crimean Federal University
- 期: 卷 50, 编号 6 (2016)
- 页面: 810-814
- 栏目: Physics of Semiconductor Devices
- URL: https://ogarev-online.ru/1063-7826/article/view/197279
- DOI: https://doi.org/10.1134/S1063782616060269
- ID: 197279
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详细
The dependences of the electrical characteristics of thin-film structures with Schottky barrier on gallium arsenide are studied using Monte Carlo numerical simulation in the kinetic approximation with the main scattering mechanisms taken into account. The dependences of the diode conductivity on the voltage and channel thickness are obtained. It is shown that the relation between the diode voltage and conductivity changes at a small channel thickness, which is explained by barrier field expulsion to the substrate.
作者简介
S. Zuev
Vernadsky Crimean Federal University
编辑信件的主要联系方式.
Email: sazuev@yandex.ru
俄罗斯联邦, ul. Vernadskogo 4, Simferopol, 295007
G. Kilessa
Vernadsky Crimean Federal University
Email: sazuev@yandex.ru
俄罗斯联邦, ul. Vernadskogo 4, Simferopol, 295007
E. Asanov
Vernadsky Crimean Federal University
Email: sazuev@yandex.ru
俄罗斯联邦, ul. Vernadskogo 4, Simferopol, 295007
V. Starostenko
Vernadsky Crimean Federal University
Email: sazuev@yandex.ru
俄罗斯联邦, ul. Vernadskogo 4, Simferopol, 295007
S. Pokrova
Vernadsky Crimean Federal University
Email: sazuev@yandex.ru
俄罗斯联邦, ul. Vernadskogo 4, Simferopol, 295007
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