Dependence of the conductivity on the active-region thickness in GaAs thin-film Schottky diodes
- Авторы: Zuev S.A.1, Kilessa G.V.1, Asanov E.E.1, Starostenko V.V.1, Pokrova S.V.1
-
Учреждения:
- Vernadsky Crimean Federal University
- Выпуск: Том 50, № 6 (2016)
- Страницы: 810-814
- Раздел: Physics of Semiconductor Devices
- URL: https://ogarev-online.ru/1063-7826/article/view/197279
- DOI: https://doi.org/10.1134/S1063782616060269
- ID: 197279
Цитировать
Аннотация
The dependences of the electrical characteristics of thin-film structures with Schottky barrier on gallium arsenide are studied using Monte Carlo numerical simulation in the kinetic approximation with the main scattering mechanisms taken into account. The dependences of the diode conductivity on the voltage and channel thickness are obtained. It is shown that the relation between the diode voltage and conductivity changes at a small channel thickness, which is explained by barrier field expulsion to the substrate.
Об авторах
S. Zuev
Vernadsky Crimean Federal University
Автор, ответственный за переписку.
Email: sazuev@yandex.ru
Россия, ul. Vernadskogo 4, Simferopol, 295007
G. Kilessa
Vernadsky Crimean Federal University
Email: sazuev@yandex.ru
Россия, ul. Vernadskogo 4, Simferopol, 295007
E. Asanov
Vernadsky Crimean Federal University
Email: sazuev@yandex.ru
Россия, ul. Vernadskogo 4, Simferopol, 295007
V. Starostenko
Vernadsky Crimean Federal University
Email: sazuev@yandex.ru
Россия, ul. Vernadskogo 4, Simferopol, 295007
S. Pokrova
Vernadsky Crimean Federal University
Email: sazuev@yandex.ru
Россия, ul. Vernadskogo 4, Simferopol, 295007
Дополнительные файлы
