Resistance Switching in Ag, Au, and Cu Films at the Percolation Threshold


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A straightforward method for thin metal films production and bringing them at the percolation threshold has been developed. The method is based on the controlled thermal annealing of initially conductive metal films. Electrical conductivity studies of thin silver, gold, and copper films at the percolation threshold revealed the existence of high-resistance states (1012 Ω) and low-resistance states (103 Ω) of the films. The switching between these states under bias is reversible. The characteristic switching times are 200 ns, 2 μs, and 60 μs for silver, gold, and copper films, correspondently.

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I. Gladskikh

Saint Petersburg State University of Information Technologies, Mechanics and Optics (ITMO University)

编辑信件的主要联系方式.
Email: 138020@mail.ru
俄罗斯联邦, St. Petersburg, 197101

M. Gushchin

Saint Petersburg State University of Information Technologies, Mechanics and Optics (ITMO University)

Email: 138020@mail.ru
俄罗斯联邦, St. Petersburg, 197101

T. Vartanyan

Saint Petersburg State University of Information Technologies, Mechanics and Optics (ITMO University)

Email: 138020@mail.ru
俄罗斯联邦, St. Petersburg, 197101

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