Simulation of the Formation of a Cascade of Displacements and Transient Ionization Processes in Silicon Semiconductor Structures under Neutron Exposure


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

The formation of a disordered defect region in bulk silicon is simulated using the molecular-dynamics method for various energies of a primary recoil atom. Variations in the volume and number of radiation-induced defects in a cluster during its formation are calculated. The generation rates of nonequilibrium carriers and amplitude-temporal dependences of pulses of ionization currents in test Schottky diodes with hyperhigh frequencies are found theoretically.

Авторлар туралы

I. Zabavichev

Lobachevsky State University of Nizhny Novgorod; Branch of the Russian Federal Nuclear Center All-Russian Research Institute of Experimental Physics “Sedakov Scientific Research Institute of Measurement Systems”

Хат алмасуға жауапты Автор.
Email: zabavichev.rf@gmail.com
Ресей, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950

A. Potehin

Lobachevsky State University of Nizhny Novgorod; Branch of the Russian Federal Nuclear Center All-Russian Research Institute of Experimental Physics “Sedakov Scientific Research Institute of Measurement Systems”

Email: zabavichev.rf@gmail.com
Ресей, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950

A. Puzanov

Lobachevsky State University of Nizhny Novgorod; Branch of the Russian Federal Nuclear Center All-Russian Research Institute of Experimental Physics “Sedakov Scientific Research Institute of Measurement Systems”

Email: zabavichev.rf@gmail.com
Ресей, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950

S. Obolenskiy

Lobachevsky State University of Nizhny Novgorod; Branch of the Russian Federal Nuclear Center All-Russian Research Institute of Experimental Physics “Sedakov Scientific Research Institute of Measurement Systems”

Email: zabavichev.rf@gmail.com
Ресей, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950

V. Kozlov

Institute for Physics of Microstructures, Russian Academy of Sciences

Email: zabavichev.rf@gmail.com
Ресей, Nizhny Novgorod, 603087

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML

© Pleiades Publishing, Ltd., 2019