Investigation of the Far-IR Reflection Spectra of SmS Single Crystals and Polycrystals in the Homogeneity Range
- 作者: Ulashkevich Y.V.1, Kaminskiy V.V.1, Romanova M.V.1, Sharenkova N.V.1
-
隶属关系:
- Ioffe Institute
- 期: 卷 52, 编号 2 (2018)
- 页面: 172-176
- 栏目: Spectroscopy, Interaction with Radiation
- URL: https://ogarev-online.ru/1063-7826/article/view/202394
- DOI: https://doi.org/10.1134/S1063782618020227
- ID: 202394
如何引用文章
详细
The far- and mid-IR reflection spectra of Sm1 + xS (x = 0–0.17) samples are recorded and analyzed, as well as their electrical and structural parameters at a temperature of T = 300 K. The bond ionicity in SmS is shown to fall with a decrease in the area of the X-ray coherent scattering region and an increase in the concentration of donor impurities and, consequently, conduction electron concentration. The electrical conductivity of stoichiometric SmS single crystals and polycrystals can be determined with an error of 10% from the IR reflection spectra. Due to the low structural quality of the samples, the electrical conductivity cannot be determined in the case of deviation from stoichiometry.
作者简介
Yu. Ulashkevich
Ioffe Institute
Email: vladimir.kaminski@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
V. Kaminskiy
Ioffe Institute
编辑信件的主要联系方式.
Email: vladimir.kaminski@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
M. Romanova
Ioffe Institute
Email: vladimir.kaminski@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
N. Sharenkova
Ioffe Institute
Email: vladimir.kaminski@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
补充文件
