Preparation and study of ferroelectric films of La0.7Sr0.3MnO3

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Abstract

This paper presents the results of fabricating ferroelectric La0.7Sr0.3MnO3 (LSMO) thin films on silicon substrates. Oriented LSMO films were obtained using magnetron sputtering followed by annealing. Capacitance-voltage (C–V) measurements of the Ni-LSMO-Si metal-insulator-semiconductor (MIS) structures revealed that thermal treatment at 800 °C induces ferroelectric properties in the LSMO films. This is evidenced by a C–V hysteresis loop with a width of 5 V and a more than two-fold increase in the capacitance switching ratio. The demonstrated method shows promise for the integration of ferroelectric LSMO into silicon technology.

About the authors

V. A Luzanov

Fryazino branch Kotelnikov Institute of Radioengineering and Electronics RAS

Email: valery@luzanov.ru
Fryazino, Russian Federation

D. A Belorusov

Fryazino branch Kotelnikov Institute of Radioengineering and Electronics RAS

Fryazino, Russian Federation

G. V Chucheva

Fryazino branch Kotelnikov Institute of Radioengineering and Electronics RAS

Fryazino, Russian Federation

References

  1. Шайхулов Т.А., Станкевич К.Л., Лузанов В.А. и др. // Письма в ЖТФ. 2023. Т. 49. № 12. С. 18.
  2. Annese E., Mori T.J.A., Schio P. et al. // J. Magn. Magn. Mater. 2020. V. 507. Article No. 166812.
  3. Гольдман Е.И., Ждан А.Г., Чучева Г.В. // ПТЭ. 1997. № 2. С. 110.

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