Preparation and study of ferroelectric films of La0.7Sr0.3MnO3

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This paper presents the results of fabricating ferroelectric La0.7Sr0.3MnO3 (LSMO) thin films on silicon substrates. Oriented LSMO films were obtained using magnetron sputtering followed by annealing. Capacitance-voltage (C–V) measurements of the Ni-LSMO-Si metal-insulator-semiconductor (MIS) structures revealed that thermal treatment at 800 °C induces ferroelectric properties in the LSMO films. This is evidenced by a C–V hysteresis loop with a width of 5 V and a more than two-fold increase in the capacitance switching ratio. The demonstrated method shows promise for the integration of ferroelectric LSMO into silicon technology.

Sobre autores

V. Luzanov

Fryazino branch Kotelnikov Institute of Radioengineering and Electronics RAS

Email: valery@luzanov.ru
Fryazino, Russian Federation

D. Belorusov

Fryazino branch Kotelnikov Institute of Radioengineering and Electronics RAS

Fryazino, Russian Federation

G. Chucheva

Fryazino branch Kotelnikov Institute of Radioengineering and Electronics RAS

Fryazino, Russian Federation

Bibliografia

  1. Шайхулов Т.А., Станкевич К.Л., Лузанов В.А. и др. // Письма в ЖТФ. 2023. Т. 49. № 12. С. 18.
  2. Annese E., Mori T.J.A., Schio P. et al. // J. Magn. Magn. Mater. 2020. V. 507. Article No. 166812.
  3. Гольдман Е.И., Ждан А.Г., Чучева Г.В. // ПТЭ. 1997. № 2. С. 110.

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