Total External Reflection of X Rays from Polycrystal Solid Surface
- Autores: Stozharov V.M.1, Pronin V.P.1
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Afiliações:
- Gertsen State Pedagogical University
- Edição: Volume 62, Nº 12 (2017)
- Páginas: 1899-1902
- Seção: Physical Electronics
- URL: https://ogarev-online.ru/1063-7842/article/view/200440
- DOI: https://doi.org/10.1134/S1063784217120246
- ID: 200440
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Resumo
Total external reflection of X rays from surfaces of several polycrystalline metals is analyzed. The roentgenograms of total reflection and X-ray diffraction are comprehensively studied for nickel, copper, silver, platinum, and bismuth. Theoretical processing of experimental roentgenograms is used to calculate Xray refractive indices, number of surface crystallites, interplane distances, and remaining quantities for polycrystalline metals. It is shown that the refractive index inversely depends on the interplane distance in crystallites of polycrystalline solids. Total reflection of X rays from the lead zirconate titanate ferroelectric film is studied.
Sobre autores
V. Stozharov
Gertsen State Pedagogical University
Autor responsável pela correspondência
Email: qut1111@yandex.ru
Rússia, St. Petersburg, 191186
V. Pronin
Gertsen State Pedagogical University
Email: qut1111@yandex.ru
Rússia, St. Petersburg, 191186
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