Total External Reflection of X Rays from Polycrystal Solid Surface
- Авторлар: Stozharov V.M.1, Pronin V.P.1
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Мекемелер:
- Gertsen State Pedagogical University
- Шығарылым: Том 62, № 12 (2017)
- Беттер: 1899-1902
- Бөлім: Physical Electronics
- URL: https://ogarev-online.ru/1063-7842/article/view/200440
- DOI: https://doi.org/10.1134/S1063784217120246
- ID: 200440
Дәйексөз келтіру
Аннотация
Total external reflection of X rays from surfaces of several polycrystalline metals is analyzed. The roentgenograms of total reflection and X-ray diffraction are comprehensively studied for nickel, copper, silver, platinum, and bismuth. Theoretical processing of experimental roentgenograms is used to calculate Xray refractive indices, number of surface crystallites, interplane distances, and remaining quantities for polycrystalline metals. It is shown that the refractive index inversely depends on the interplane distance in crystallites of polycrystalline solids. Total reflection of X rays from the lead zirconate titanate ferroelectric film is studied.
Авторлар туралы
V. Stozharov
Gertsen State Pedagogical University
Хат алмасуға жауапты Автор.
Email: qut1111@yandex.ru
Ресей, St. Petersburg, 191186
V. Pronin
Gertsen State Pedagogical University
Email: qut1111@yandex.ru
Ресей, St. Petersburg, 191186
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