Total External Reflection of X Rays from Polycrystal Solid Surface
- Authors: Stozharov V.M.1, Pronin V.P.1
-
Affiliations:
- Gertsen State Pedagogical University
- Issue: Vol 62, No 12 (2017)
- Pages: 1899-1902
- Section: Physical Electronics
- URL: https://ogarev-online.ru/1063-7842/article/view/200440
- DOI: https://doi.org/10.1134/S1063784217120246
- ID: 200440
Cite item
Abstract
Total external reflection of X rays from surfaces of several polycrystalline metals is analyzed. The roentgenograms of total reflection and X-ray diffraction are comprehensively studied for nickel, copper, silver, platinum, and bismuth. Theoretical processing of experimental roentgenograms is used to calculate Xray refractive indices, number of surface crystallites, interplane distances, and remaining quantities for polycrystalline metals. It is shown that the refractive index inversely depends on the interplane distance in crystallites of polycrystalline solids. Total reflection of X rays from the lead zirconate titanate ferroelectric film is studied.
About the authors
V. M. Stozharov
Gertsen State Pedagogical University
Author for correspondence.
Email: qut1111@yandex.ru
Russian Federation, St. Petersburg, 191186
V. P. Pronin
Gertsen State Pedagogical University
Email: qut1111@yandex.ru
Russian Federation, St. Petersburg, 191186
Supplementary files
