Forming an Edge Dislocation Image at Anomalous X-ray Transmission
- 作者: Smirnova I.A.1, Shulakov E.V.2, Suvorov E.V.1
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隶属关系:
- Institute of Solid State Physics, Russian Academy of Sciences
- Institute of Microelectronics Technology and High Purity Materials
- 期: 卷 61, 编号 8 (2019)
- 页面: 1444-1449
- 栏目: Mechanical Properties, Physics of Strength, and Plasticity
- URL: https://ogarev-online.ru/1063-7834/article/view/206029
- DOI: https://doi.org/10.1134/S1063783419080250
- ID: 206029
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详细
The features of forming section and projection topography images of an edge dislocation normal to the crystal surface are considered for the case of X-ray anomalous transmission. Experimental images are analyzed using numerical simulation of the diffraction experiment. A new mechanism for image formation of defects arranged near the output crystal surface has been proposed. Differences between topography images of dislocations and rosettes of local misorientations of reflecting planes have been established.
作者简介
I. Smirnova
Institute of Solid State Physics, Russian Academy of Sciences
编辑信件的主要联系方式.
Email: irina@issp.ac.ru
俄罗斯联邦, Chernogolovka, Moscow oblast, 142432
E. Shulakov
Institute of Microelectronics Technology and High Purity Materials
Email: irina@issp.ac.ru
俄罗斯联邦, Chernogolovka, Moscow oblast, 142432
E. Suvorov
Institute of Solid State Physics, Russian Academy of Sciences
Email: irina@issp.ac.ru
俄罗斯联邦, Chernogolovka, Moscow oblast, 142432
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