Forming an Edge Dislocation Image at Anomalous X-ray Transmission
- Авторлар: Smirnova I.A.1, Shulakov E.V.2, Suvorov E.V.1
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Мекемелер:
- Institute of Solid State Physics, Russian Academy of Sciences
- Institute of Microelectronics Technology and High Purity Materials
- Шығарылым: Том 61, № 8 (2019)
- Беттер: 1444-1449
- Бөлім: Mechanical Properties, Physics of Strength, and Plasticity
- URL: https://ogarev-online.ru/1063-7834/article/view/206029
- DOI: https://doi.org/10.1134/S1063783419080250
- ID: 206029
Дәйексөз келтіру
Аннотация
The features of forming section and projection topography images of an edge dislocation normal to the crystal surface are considered for the case of X-ray anomalous transmission. Experimental images are analyzed using numerical simulation of the diffraction experiment. A new mechanism for image formation of defects arranged near the output crystal surface has been proposed. Differences between topography images of dislocations and rosettes of local misorientations of reflecting planes have been established.
Авторлар туралы
I. Smirnova
Institute of Solid State Physics, Russian Academy of Sciences
Хат алмасуға жауапты Автор.
Email: irina@issp.ac.ru
Ресей, Chernogolovka, Moscow oblast, 142432
E. Shulakov
Institute of Microelectronics Technology and High Purity Materials
Email: irina@issp.ac.ru
Ресей, Chernogolovka, Moscow oblast, 142432
E. Suvorov
Institute of Solid State Physics, Russian Academy of Sciences
Email: irina@issp.ac.ru
Ресей, Chernogolovka, Moscow oblast, 142432
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