Forming an Edge Dislocation Image at Anomalous X-ray Transmission
- Autores: Smirnova I.A.1, Shulakov E.V.2, Suvorov E.V.1
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Afiliações:
- Institute of Solid State Physics, Russian Academy of Sciences
- Institute of Microelectronics Technology and High Purity Materials
- Edição: Volume 61, Nº 8 (2019)
- Páginas: 1444-1449
- Seção: Mechanical Properties, Physics of Strength, and Plasticity
- URL: https://ogarev-online.ru/1063-7834/article/view/206029
- DOI: https://doi.org/10.1134/S1063783419080250
- ID: 206029
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Resumo
The features of forming section and projection topography images of an edge dislocation normal to the crystal surface are considered for the case of X-ray anomalous transmission. Experimental images are analyzed using numerical simulation of the diffraction experiment. A new mechanism for image formation of defects arranged near the output crystal surface has been proposed. Differences between topography images of dislocations and rosettes of local misorientations of reflecting planes have been established.
Sobre autores
I. Smirnova
Institute of Solid State Physics, Russian Academy of Sciences
Autor responsável pela correspondência
Email: irina@issp.ac.ru
Rússia, Chernogolovka, Moscow oblast, 142432
E. Shulakov
Institute of Microelectronics Technology and High Purity Materials
Email: irina@issp.ac.ru
Rússia, Chernogolovka, Moscow oblast, 142432
E. Suvorov
Institute of Solid State Physics, Russian Academy of Sciences
Email: irina@issp.ac.ru
Rússia, Chernogolovka, Moscow oblast, 142432
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