Growth and optical properties of filamentary GaN nanocrystals grown on a hybrid SiC/Si(111) substrate by molecular beam epitaxy
- Авторы: Reznik R.R.1,2,3, Kotlyar K.P.1,4, Il’kiv I.V.1,2, Soshnikov I.P.1,4,5, Kukushkin S.A.1,3,6, Osipov A.V.1,3,6, Nikitina E.V.1, Cirlin G.E.1,3,7
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Учреждения:
- St. Petersburg Academic University
- Peter the Great St. Petersburg Polytechnic University
- ITMO University
- Ioffe Physiсal-Techniсal Institute
- St. Petersburg Electrotechnical University “LETI,”
- Institute of Problems of Mechanical Engineering
- Institute for Analytical Instrumentation
- Выпуск: Том 58, № 10 (2016)
- Страницы: 1952-1955
- Раздел: Semiconductors
- URL: https://ogarev-online.ru/1063-7834/article/view/198751
- DOI: https://doi.org/10.1134/S1063783416100292
- ID: 198751
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Аннотация
The potential to grow filamentary GaN nanocrystals by molecular beam epitaxy on a silicon substrate with a nanosized buffer layer of silicon carbide has been demonstrated. Morphological and optical properties of the obtained system have been studied. It has been shown that the intensity of the photoluminescence spectrum peak of such structures is higher than that of the best filamentary GaN nanocrystals without the buffer silicon carbide layer by a factor of more than two.
Об авторах
R. Reznik
St. Petersburg Academic University; Peter the Great St. Petersburg Polytechnic University; ITMO University
Автор, ответственный за переписку.
Email: moment92@mail.ru
Россия, ul. Khlopina 8/3, St. Petersburg, 194021; Politekhnicheskaya ul. 29, St. Petersburg, 195251; Kronverkskii pr. 49, St. Petersburg, 197101
K. Kotlyar
St. Petersburg Academic University; Ioffe Physiсal-Techniсal Institute
Email: moment92@mail.ru
Россия, ul. Khlopina 8/3, St. Petersburg, 194021; Politekhnicheskaya ul. 26, St. Petersburg, 194021
I. Il’kiv
St. Petersburg Academic University; Peter the Great St. Petersburg Polytechnic University
Email: moment92@mail.ru
Россия, ul. Khlopina 8/3, St. Petersburg, 194021; Politekhnicheskaya ul. 29, St. Petersburg, 195251
I. Soshnikov
St. Petersburg Academic University; Ioffe Physiсal-Techniсal Institute; St. Petersburg Electrotechnical University “LETI,”
Email: moment92@mail.ru
Россия, ul. Khlopina 8/3, St. Petersburg, 194021; Politekhnicheskaya ul. 26, St. Petersburg, 194021; ul. Popova 5/5, St. Petersburg, 197376
S. Kukushkin
St. Petersburg Academic University; ITMO University; Institute of Problems of Mechanical Engineering
Email: moment92@mail.ru
Россия, ul. Khlopina 8/3, St. Petersburg, 194021; Kronverkskii pr. 49, St. Petersburg, 197101; Bol’shoi pr. 61, St. Petersburg, 199178
A. Osipov
St. Petersburg Academic University; ITMO University; Institute of Problems of Mechanical Engineering
Email: moment92@mail.ru
Россия, ul. Khlopina 8/3, St. Petersburg, 194021; Kronverkskii pr. 49, St. Petersburg, 197101; Bol’shoi pr. 61, St. Petersburg, 199178
E. Nikitina
St. Petersburg Academic University
Email: moment92@mail.ru
Россия, ul. Khlopina 8/3, St. Petersburg, 194021
G. Cirlin
St. Petersburg Academic University; ITMO University; Institute for Analytical Instrumentation
Email: moment92@mail.ru
Россия, ul. Khlopina 8/3, St. Petersburg, 194021; Kronverkskii pr. 49, St. Petersburg, 197101; Rizhskii pr. 26, St. Petersburg, 190103
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