Отправить статью по E-mail Structural features of Sm1–xEuxS thin polycrystalline films
- Авторы: Kaminskii V.V.1, Solov’ev S.M.1, Khavrov G.D.1, Sharenkova N.V.1, Hirai S.2
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Учреждения:
- Ioffe Institute
- Muroran Institute of Technology
- Выпуск: Том 51, № 6 (2017)
- Страницы: 828-830
- Раздел: Fabrication, Treatment, and Testing of Materials and Structures
- URL: https://ogarev-online.ru/1063-7826/article/view/200124
- DOI: https://doi.org/10.1134/S1063782617060124
- ID: 200124
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Аннотация
Thin polycrystalline Sm1–xEuxS films (x = 0.1, 0.167, 0.2, 0.25, 0.33, 0.5) were prepared by evaporation of SmS and EuS powders. Structural features of the films were investigated. The influence of Eu concentration and temperature of film deposition on the value of lattice parameter and sizes of X-гау coherent scattering regions was studied. It is shown that formation of Sm1–xEuxS films comes about according to the theory that was previously suggested for SmS films and that the deviation of lattice parameter is explained by the variable valence of samarium ions.
Об авторах
V. Kaminskii
Ioffe Institute
Автор, ответственный за переписку.
Email: Vladimir.Kaminski@mail.ioffe.ru
Россия, St. Petersburg, 194021
S. Solov’ev
Ioffe Institute
Email: Vladimir.Kaminski@mail.ioffe.ru
Россия, St. Petersburg, 194021
G. Khavrov
Ioffe Institute
Email: Vladimir.Kaminski@mail.ioffe.ru
Россия, St. Petersburg, 194021
N. Sharenkova
Ioffe Institute
Email: Vladimir.Kaminski@mail.ioffe.ru
Россия, St. Petersburg, 194021
Shinji Hirai
Muroran Institute of Technology
Email: Vladimir.Kaminski@mail.ioffe.ru
Япония, Muroran, Hokkaido, 050-8585
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