Evaluation of the Impact of Surface Recombination in Microdisk Lasers by Means of High-Frequency Modulation
- Autores: Blokhin S.A.1, Kulagina M.M.1, Guseva Y.A.1, Mintairov S.A.2,1, Kalyuzhnyy N.A.2,1, Mozharov A.M.2, Zubov F.I.2, Maximov M.V.2, Zhukov A.E.2,3, Moiseev E.I.2, Kryzhanovskaya N.V.2,3
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Afiliações:
- Ioffe Institute
- St. Petersburg National Research Academic University, Russian Academy of Sciences
- Peter the Great St. Petersburg Polytechnic University
- Edição: Volume 53, Nº 8 (2019)
- Páginas: 1099-1103
- Seção: Physics of Semiconductor Devices
- URL: https://ogarev-online.ru/1063-7826/article/view/206658
- DOI: https://doi.org/10.1134/S1063782619080220
- ID: 206658
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Resumo
Microdisk lasers 10–30 μm in diameter operating at room temperature without thermal stabilization and with an active region based on nanostructures of hybrid dimensionality—quantum wells–dots—are investigated. High-frequency measurements of the microlaser response are performed in the direct small-signal modulation mode, which makes it possible to establish the parameters of the operating speed and analyze their dependence on the microlaser diameter. It is found that the K factor is (0.8 ± 0.2) ns, which corresponds to optical losses of ~6 cm–1, and no regular dependence on the diameter is observed. It is found that the low-frequency component of the damping coefficient of relaxation oscillations is inversely proportional to the diameter. This character of the dependence evidences a decrease in the carrier lifetime in small-diameter microcavities, which can be associated with the prevalence of nonradiative recombination on their side walls.
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Sobre autores
S. Blokhin
Ioffe Institute
Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021
M. Kulagina
Ioffe Institute
Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021
Yu. Guseva
Ioffe Institute
Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021
S. Mintairov
St. Petersburg National Research Academic University, Russian Academy of Sciences; Ioffe Institute
Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021; St. Petersburg, 194021
N. Kalyuzhnyy
St. Petersburg National Research Academic University, Russian Academy of Sciences; Ioffe Institute
Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021; St. Petersburg, 194021
A. Mozharov
St. Petersburg National Research Academic University, Russian Academy of Sciences
Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021
F. Zubov
St. Petersburg National Research Academic University, Russian Academy of Sciences
Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021
M. Maximov
St. Petersburg National Research Academic University, Russian Academy of Sciences
Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021
A. Zhukov
St. Petersburg National Research Academic University, Russian Academy of Sciences; Peter the Great St. Petersburg Polytechnic University
Autor responsável pela correspondência
Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021; St. Petersburg, 195251
E. Moiseev
St. Petersburg National Research Academic University, Russian Academy of Sciences
Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021
N. Kryzhanovskaya
St. Petersburg National Research Academic University, Russian Academy of Sciences; Peter the Great St. Petersburg Polytechnic University
Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021; St. Petersburg, 195251
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