Evaluation of the Impact of Surface Recombination in Microdisk Lasers by Means of High-Frequency Modulation


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Resumo

Microdisk lasers 10–30 μm in diameter operating at room temperature without thermal stabilization and with an active region based on nanostructures of hybrid dimensionality—quantum wells–dots—are investigated. High-frequency measurements of the microlaser response are performed in the direct small-signal modulation mode, which makes it possible to establish the parameters of the operating speed and analyze their dependence on the microlaser diameter. It is found that the K factor is (0.8 ± 0.2) ns, which corresponds to optical losses of ~6 cm–1, and no regular dependence on the diameter is observed. It is found that the low-frequency component of the damping coefficient of relaxation oscillations is inversely proportional to the diameter. This character of the dependence evidences a decrease in the carrier lifetime in small-diameter microcavities, which can be associated with the prevalence of nonradiative recombination on their side walls.

Sobre autores

S. Blokhin

Ioffe Institute

Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021

M. Kulagina

Ioffe Institute

Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021

Yu. Guseva

Ioffe Institute

Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021

S. Mintairov

St. Petersburg National Research Academic University, Russian Academy of Sciences; Ioffe Institute

Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021; St. Petersburg, 194021

N. Kalyuzhnyy

St. Petersburg National Research Academic University, Russian Academy of Sciences; Ioffe Institute

Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021; St. Petersburg, 194021

A. Mozharov

St. Petersburg National Research Academic University, Russian Academy of Sciences

Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021

F. Zubov

St. Petersburg National Research Academic University, Russian Academy of Sciences

Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021

M. Maximov

St. Petersburg National Research Academic University, Russian Academy of Sciences

Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021

A. Zhukov

St. Petersburg National Research Academic University, Russian Academy of Sciences; Peter the Great St. Petersburg Polytechnic University

Autor responsável pela correspondência
Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021; St. Petersburg, 195251

E. Moiseev

St. Petersburg National Research Academic University, Russian Academy of Sciences

Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021

N. Kryzhanovskaya

St. Petersburg National Research Academic University, Russian Academy of Sciences; Peter the Great St. Petersburg Polytechnic University

Email: zhukale@gmail.com
Rússia, St. Petersburg, 194021; St. Petersburg, 195251

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