Enviar artigo por via de e-mail Setup for Measuring the Thermoelectric Properties of Ultrathin Wires
- Autores: Uryupin O.N.1, Shabaldin A.A.1
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Afiliações:
- Ioffe Institute
- Edição: Volume 53, Nº 5 (2019)
- Páginas: 695-698
- Seção: XVI International Conference “thermoelectrics and Their Applications–2018” (Iscta 2018,) St. Petersburg, October 8–12, 2018
- URL: https://ogarev-online.ru/1063-7826/article/view/206193
- DOI: https://doi.org/10.1134/S1063782619050270
- ID: 206193
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Resumo
An experimental setup is developed to measure the thermoelectric properties of semiconductor nanowires with diameters of up to 5 nm in dielectric matrices. This setup makes it possible to measure the electrical resistance and thermoelectric power of nanostructured samples in the temperature range of 77–400 K.
Sobre autores
O. Uryupin
Ioffe Institute
Autor responsável pela correspondência
Email: O.uryupin@mail.ioffe.ru
Rússia, St. Petersburg, 194021
A. Shabaldin
Ioffe Institute
Email: O.uryupin@mail.ioffe.ru
Rússia, St. Petersburg, 194021
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