Effect of Plasma-Chemical Surface Modification on the Electron Transport and Work Function in Silicon Crystals
- Авторлар: Yafarov R.K.1
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Мекемелер:
- Kotel’nikov Institute of Radio Engineering and Electronics (Saratov Branch), Russian Academy of Sciences
- Шығарылым: Том 53, № 1 (2019)
- Беттер: 14-21
- Бөлім: Surfaces, Interfaces, and Thin Films
- URL: https://ogarev-online.ru/1063-7826/article/view/205552
- DOI: https://doi.org/10.1134/S106378261901024X
- ID: 205552
Дәйексөз келтіру
Аннотация
The regularities governing the surface modification of silicon crystals during microwave-plasma microprocessing in different chemically active gaseous media are investigated. This modification is shown to be caused by the formation of built-in surface potentials, which, depending on the semiconductor electrical-conductivity type, differently affect the field-emission properties and surface electron transport in devices based on them.
Авторлар туралы
R. Yafarov
Kotel’nikov Institute of Radio Engineering and Electronics (Saratov Branch), Russian Academy of Sciences
Хат алмасуға жауапты Автор.
Email: pirpc@yandex.ru
Ресей, Saratov, 410019
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