Methods and Technique of Measurements
| 期 | 标题 | 文件 | |
| 卷 51, 编号 13 (2017) | Determining the Free Carrier Density in CdxHg1–xTe Solid Solutions from Far-Infrared Reflection Spectra |
 (Eng) |
|
| Belov A., Denisov I., Kanevskii V., Pashkova N., Lysenko A. | |||
| 卷 50, 编号 13 (2016) | Study of the structure and composition of the strained epitaxial layer in the InAlAs/GaAs(100) heterostructure by transmission electron microscopy |
(Eng) |
|
| Lovygin M., Borgardt N., Bugaev A., Volkov R., Seibt M. | |||
| 卷 50, 编号 13 (2016) | Measurements of electrophysical characteristics of semiconductor structures with the use of microwave photonic crystals |
(Eng) |
|
| Usanov D., Nikitov S., Skripal A., Ponomarev D., Latysheva E. | |||
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