Electron emission from Cs/GaAs and GaAs(Cs, О) with positive and negative electron affinity
- Авторлар: Zhuravlev A.G.1,2, Khoroshilov V.S.1,2, Alperovich V.L.1,2
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Мекемелер:
- Rzhanov Institute of Semiconductor Physics, Siberian Branch
- Novosibirsk State University
- Шығарылым: Том 105, № 10 (2017)
- Беттер: 686-690
- Бөлім: Miscellaneous
- URL: https://ogarev-online.ru/0021-3640/article/view/160330
- DOI: https://doi.org/10.1134/S0021364017100149
- ID: 160330
Дәйексөз келтіру
Аннотация
The evolution of probabilities of escape of hot and thermalized electrons from GaAs(001) with adsorbed cesium and oxygen layers to vacuum at the transition from positive to negative effective electron affinity is studied by the photoemission quantum yield spectroscopy. A minimum of the probability of escape of thermalized electrons near zero electron affinity is revealed and explained.
Авторлар туралы
A. Zhuravlev
Rzhanov Institute of Semiconductor Physics, Siberian Branch; Novosibirsk State University
Email: alper@isp.nsc.ru
Ресей, Novosibirsk, 630090; Novosibirsk, 630090
V. Khoroshilov
Rzhanov Institute of Semiconductor Physics, Siberian Branch; Novosibirsk State University
Email: alper@isp.nsc.ru
Ресей, Novosibirsk, 630090; Novosibirsk, 630090
V. Alperovich
Rzhanov Institute of Semiconductor Physics, Siberian Branch; Novosibirsk State University
Хат алмасуға жауапты Автор.
Email: alper@isp.nsc.ru
Ресей, Novosibirsk, 630090; Novosibirsk, 630090
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