MEASURING CIRCUIT FOR CONVERSION PARAMETERS OF THE MIS-STRUCTURE
- Authors: Chaykovskiy V.M.1
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Affiliations:
- Penza State University
- Issue: No 2 (2025)
- Pages: 68-73
- Section: DEVICES AND METHODS OF MEASURING
- URL: https://ogarev-online.ru/2307-5538/article/view/296504
- DOI: https://doi.org/10.21685/2307-5538-2025-2-8
- ID: 296504
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Abstract
Background. The information value of the process of measuring the parameters of the MIS-structure is determined to the maximum extent by the configuration of the measuring circuit, which converts the parameters of the MISstructure as a passive object into active values. Materials and methods. It is proposed to build a measuring circuit of two series-connected operational amplifiers covered by common AC feedback. The justification for the configuration of the measuring circuit is based both on the use of the invariant transformation method and the foundations of the theory of a DC amplifier, using the Laplace transform. Results. Carried out comparative analysis of the transfer function of the measuring circuit with a different character of the resistance connecting the operational amplifiers of the measuring circuitmade it possible to choose the character of this resistance. As a result, the nature of all resistances in the measuring circuit acquired its final form. Conclusions. Use measuring circuit with the structure under consideration as part of a measuring device designed to assess the value of MIS-structures parameters, especially in debugging the technology of their manufacturing process, will increase the percentage of yield of various components produced on their basis.
About the authors
Victor M. Chaykovskiy
Penza State University
Author for correspondence.
Email: radiolokaci@yandex.ru
Candidate of technical sciences, associate professor, associate professor of the sub-department of radio engineering and radio electronic systems
(40 Krasnaya street, Penza, Russia)References
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