Single fault detection test sets with respect to stuck-at faults at the outputs of gates in formulas over one basis of Zhegalkin type
- Autores: Cui Z.1, Romanov D.S.2
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Afiliações:
- Lomonosov Moscow State University
- Edição: Volume 89, Nº 6 (2025)
- Páginas: 206-218
- Seção: Articles
- URL: https://ogarev-online.ru/1607-0046/article/view/358695
- DOI: https://doi.org/10.4213/im9667
- ID: 358695
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Resumo
The article establishes the exact values of the Shannon function of the cardinality of a single fault detection test set with respect to stuck-at faults at outputs of gates in formulas over the basis \( \{\, x \& y,\; x \oplus y,\; x \sim y \,\}\ \)
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Sobre autores
Zhenyu Cui
Lomonosov Moscow State University
Autor responsável pela correspondência
Email: ourobros1234@gmail.com
Dmitrii Romanov
Email: romanov@cs.msu.ru
Doctor of physico-mathematical sciences, Associate professor
Bibliografia
- S. M. Reddy, “Easily testable realization for logic functions”, IEEE Trans. Comput., C-21:11 (1972), 1183–1188
- K. L. Kodandapani, “A note on easily testable realizations for logic functions”, IEEE Trans. Comput., C-23:3 (1974), 332–333
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