Theoretical Analysis of the Effect of dU/dt in 4H–SiC Thyristor Structures
- Авторы: Yurkov S.N.1, Mnatsakanov T.T.1, Tandoev A.G.1
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Учреждения:
- Moscow Power Engineering Institute
- Выпуск: Том 63, № 10 (2018)
- Страницы: 1497-1503
- Раздел: Solid State Electronics
- URL: https://ogarev-online.ru/1063-7842/article/view/202162
- DOI: https://doi.org/10.1134/S1063784218100250
- ID: 202162
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Аннотация
On the basis of numerical simulation, specificities of the effect of dU/dt in 4H–SiC thyristor structures, related to realization of the recently discovered triggering α-mechanism are analyzed. It is shown that one of the manifestations of this mechanism is a catastrophic reduction in the voltage blocked by a thyristor with an increase in temperature of the structure. Practical ways of eliminating this effect are discussed.
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Об авторах
S. Yurkov
Moscow Power Engineering Institute
Автор, ответственный за переписку.
Email: yurkov.sn@mail.ru
Россия, Moscow, 111250
T. Mnatsakanov
Moscow Power Engineering Institute
Email: yurkov.sn@mail.ru
Россия, Moscow, 111250
A. Tandoev
Moscow Power Engineering Institute
Email: yurkov.sn@mail.ru
Россия, Moscow, 111250
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