Frequency Dependence of the Dielectric Loss Angle in Disordered Semiconductors in the Terahertz Frequency Range
- 作者: Ormont M.A.1, Zvyagin I.P.1
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隶属关系:
- Moscow State University
- 期: 卷 60, 编号 5 (2018)
- 页面: 882-889
- 栏目: Semiconductors
- URL: https://ogarev-online.ru/1063-7834/article/view/202802
- DOI: https://doi.org/10.1134/S1063783418050232
- ID: 202802
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详细
Frequency dependence of the real part of the conductivity σ1(ω) in the region of the transition from almost linear (s < 1) to quadratic (s ≈ 2) can indicate a change in the conduction mechanism (the transition from the variable-range to the fixed-range hopping with increasing frequency); in this case, the sharpness of the change in the slope of the frequency characteristic is related to the dependence of the preexponential factor of the resonance integral on the intercenter distance in the pair. The frequency dependence of the imaginary part of the conductivity σ2(ω) has no kink in the vicinity of the transition frequency ωcr, remaining almost linear. A large dielectric loss angle |cotγ| = |σ2|/σ1 can indicate that the imaginary part of the conductivity at ω < ωcr is defined by the larger zero-phonon contribution in σ2res the region of weak variation in the loss angle γ(ω), which significantly exceeds the relaxation contribution σ2res.
作者简介
M. Ormont
Moscow State University
编辑信件的主要联系方式.
Email: ormont@phys.msu.ru
俄罗斯联邦, Moscow, 119991
I. Zvyagin
Moscow State University
Email: ormont@phys.msu.ru
俄罗斯联邦, Moscow, 119991
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