Complex formation in semiconductor silicon within the framework of the Vlasov model of a solid state
- Авторлар: Talanin V.I.1, Talanin I.E.1
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Мекемелер:
- Zaporizhzhya Institute of Economics and Information Technologies
- Шығарылым: Том 58, № 10 (2016)
- Беттер: 2050-2054
- Бөлім: Impurity Centers
- URL: https://ogarev-online.ru/1063-7834/article/view/198865
- DOI: https://doi.org/10.1134/S1063783416100371
- ID: 198865
Дәйексөз келтіру
Аннотация
The formation of silicon–carbon and silicon–oxygen complexes during cooling after the growth of dislocation-free silicon single crystals has been calculated using the Vlasov model of crystal formation. It has been confirmed that the complex formation begins in the vicinity of the crystallization front. It has been shown that the Vlasov model of a solid state can be used not only for the investigation of hypothetical ideal crystals, but also for the description of the formation of a defect structure of real crystals.
Авторлар туралы
V. Talanin
Zaporizhzhya Institute of Economics and Information Technologies
Хат алмасуға жауапты Автор.
Email: v.i.talanin@mail.ru
Украина, ul. Kiyashko 16b, Zaporizhzhya, 69015
I. Talanin
Zaporizhzhya Institute of Economics and Information Technologies
Email: v.i.talanin@mail.ru
Украина, ul. Kiyashko 16b, Zaporizhzhya, 69015
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