Effect of interaction in the Ga–As–O system on the morphology of a GaAs surface during molecular-beam epitaxy
- Авторлар: Ageev O.A.1, Balakirev S.V.1, Solodovnik M.S.1, Eremenko M.M.1
-
Мекемелер:
- Institute of Nanotechnologies, Electronics, and Electronic Equipment Engineering
- Шығарылым: Том 58, № 5 (2016)
- Беттер: 1045-1052
- Бөлім: Surface Physics and Thin Films
- URL: https://ogarev-online.ru/1063-7834/article/view/197598
- DOI: https://doi.org/10.1134/S1063783416050024
- ID: 197598
Дәйексөз келтіру
Аннотация
A thermodynamic analysis of processes of interphase interaction in the Ga–As–O system has been performed and their theoretical laws have been determined, taking into account nonlinear thermal physical properties of the compounds, the oxide film compositions, and modes of molecular-beam epitaxy of GaAs. The processes of interaction of the native oxide of GaAs with the substrate material and also with Ga and As4 from a vapor gaseous phase have been studied experimentally. The experimental results correlate with the results of the thermodynamic analysis. The laws of influence of the removal of the proper oxide on the evolution of the GaAs surface morphology under conditions of the molecular-beam epitaxy have been proposed.
Негізгі сөздер
Авторлар туралы
O. Ageev
Institute of Nanotechnologies, Electronics, and Electronic Equipment Engineering
Email: solodovnikms@mail.ru
Ресей, per. Nekrasovskii 44, Taganrog, 347928
S. Balakirev
Institute of Nanotechnologies, Electronics, and Electronic Equipment Engineering
Email: solodovnikms@mail.ru
Ресей, per. Nekrasovskii 44, Taganrog, 347928
M. Solodovnik
Institute of Nanotechnologies, Electronics, and Electronic Equipment Engineering
Хат алмасуға жауапты Автор.
Email: solodovnikms@mail.ru
Ресей, per. Nekrasovskii 44, Taganrog, 347928
M. Eremenko
Institute of Nanotechnologies, Electronics, and Electronic Equipment Engineering
Email: solodovnikms@mail.ru
Ресей, per. Nekrasovskii 44, Taganrog, 347928
Қосымша файлдар
