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Layer Crystallization in PZT/LNO/Si Heterostructures


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Abstract

A Pb(Zr0.52Ti0.48)O3–LaNiO3–Si composition and LaNiO3 thin films are synthesized using chemical solution deposition and studied by transmission electron microscopy. The polycrystalline, porous structure of LaNiO3 is found to misalign the columnar structure of lead zirconate titanate. The effect that thermal treatment has on the structure and phase composition of lanthanum nickelate is addressed. The morphological features of LaNiO3 film structure such as its layered character, porosity, and misalignment are observed in samples subjected to annealing at a temperature of 550°C and are more pronounced upon raising the temperature to 800°C.

About the authors

A. V. Atanova

Shubnikov Institute of Crystallography, Russian Academy of Sciences

Author for correspondence.
Email: atanova.a@crys.ras.ru
Russian Federation, Moscow

O. M. Zhigalina

Shubnikov Institute of Crystallography, Russian Academy of Sciences; Bauman Moscow State Technical University

Email: atanova.a@crys.ras.ru
Russian Federation, Moscow; Moscow

D. N. Khmelenin

Shubnikov Institute of Crystallography, Russian Academy of Sciences

Email: atanova.a@crys.ras.ru
Russian Federation, Moscow

D. S. Seregin

Russian Technological University (MIREA)

Email: atanova.a@crys.ras.ru
Russian Federation, Moscow

K. A. Vorotilov

Russian Technological University (MIREA)

Email: atanova.a@crys.ras.ru
Russian Federation, Moscow

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