Dielectric Properties of Oligonucleotides on the Surface of Si Nanosandwich Structures


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Resumo

Planar silicon nanostructures that are formed as a very narrow silicon quantum well confined by delta-barriers heavily doped with boron are used to study the dielectric properties of DNA oligonucleotides deposited onto the surface of the nanostructures. The capacitance characteristics of the silicon nanostructures with oligonucleotides deposited onto their surface are determined by recording the local tunneling current- voltage characteristics by means of scanning tunneling microscopy. The results show the possibility of identifying the local dielectric properties of DNA oligonucleotide segments consisting of repeating G–C pairs. These properties apparently give grounds to correlate the segments with polymer molecules exhibiting the properties of multiferroics.

Sobre autores

M. Fomin

Peter the Great St. Petersburg Polytechnic University

Autor responsável pela correspondência
Email: mr_nukem@mail.ru
Rússia, St. Petersburg, 195251

A. Chernev

St. Petersburg Academic University Nanotechnology Research and Education Centre RAS

Email: mr_nukem@mail.ru
Rússia, St. Petersburg, 194021

N. Bagraev

Ioffe Institute

Email: mr_nukem@mail.ru
Rússia, St. Petersburg, 194021

L. Klyachkin

Ioffe Institute

Email: mr_nukem@mail.ru
Rússia, St. Petersburg, 194021

A. Emelyanov

St. Petersburg Academic University Nanotechnology Research and Education Centre RAS

Email: mr_nukem@mail.ru
Rússia, St. Petersburg, 194021

M. Dubina

St. Petersburg Academic University Nanotechnology Research and Education Centre RAS

Email: mr_nukem@mail.ru
Rússia, St. Petersburg, 194021

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