Optical and electrical properties of thin NiO films deposited by reactive magnetron sputtering and spray pyrolysis
- 作者: Parkhomenko H.P.1, Solovan M.N.1, Mostovoi A.I.1, Orletskii I.G.1, Parfenyuk O.A.1, Maryanchuk P.D.1
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隶属关系:
- Fedkovich Chernivtsi National University
- 期: 卷 122, 编号 6 (2017)
- 页面: 944-948
- 栏目: Condensed-Matter Spectroscopy
- URL: https://ogarev-online.ru/0030-400X/article/view/165417
- DOI: https://doi.org/10.1134/S0030400X17060145
- ID: 165417
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详细
Thin NiO films are deposited by reactive magnetron sputtering and spray pyrolysis. The main optical constants, i.e., refractive index n(λ), absorption coefficient α(λ), extinction coefficient k(λ), and thickness d, are determined. The temperature dependence of the resistance of thin films is found, and the activation energy of films deposited by different methods is determined.
作者简介
H. Parkhomenko
Fedkovich Chernivtsi National University
编辑信件的主要联系方式.
Email: h.parkhomenko@chnu.edu.ua
乌克兰, Chernivtsi, 58012
M. Solovan
Fedkovich Chernivtsi National University
Email: h.parkhomenko@chnu.edu.ua
乌克兰, Chernivtsi, 58012
A. Mostovoi
Fedkovich Chernivtsi National University
Email: h.parkhomenko@chnu.edu.ua
乌克兰, Chernivtsi, 58012
I. Orletskii
Fedkovich Chernivtsi National University
Email: h.parkhomenko@chnu.edu.ua
乌克兰, Chernivtsi, 58012
O. Parfenyuk
Fedkovich Chernivtsi National University
Email: h.parkhomenko@chnu.edu.ua
乌克兰, Chernivtsi, 58012
P. Maryanchuk
Fedkovich Chernivtsi National University
Email: h.parkhomenko@chnu.edu.ua
乌克兰, Chernivtsi, 58012
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