Retroreflection of Optical Radiation from Ellipsoidal-Porous Surfaces
- 作者: Klass E.V.1
-
隶属关系:
- Mendeleev Central Research Institute of Chemistry and Mechanics
- 期: 卷 123, 编号 6 (2017)
- 页面: 977-982
- 栏目: Geometrical and Applied Optics
- URL: https://ogarev-online.ru/0030-400X/article/view/165599
- DOI: https://doi.org/10.1134/S0030400X1711011X
- ID: 165599
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详细
The retroreflection of optical radiation from surfaces with roughness in the form of ellipsoidal pores and two-level roughness in the form of convex ellipsoids with elliptical-porous surfaces is studied using the ROKS-RG Monte-Carlo method software in the geometrical-optics approximation. The dependence of the retroreflection phase function on the parameters of bodies that simulates the rough surface is analyzed. It is shown that the angular dependence of the retroreflection from porous rough surfaces with arbitrarily oriented pores and the aspect ratio higher than unity is a pronounced peak with concave sides at all incidence angles.
作者简介
E. Klass
Mendeleev Central Research Institute of Chemistry and Mechanics
编辑信件的主要联系方式.
Email: elenaklass@yandex.ru
俄罗斯联邦, Moscow, 115487
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