Retroreflection of Optical Radiation from Ellipsoidal-Porous Surfaces
- Authors: Klass E.V.1
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Affiliations:
- Mendeleev Central Research Institute of Chemistry and Mechanics
- Issue: Vol 123, No 6 (2017)
- Pages: 977-982
- Section: Geometrical and Applied Optics
- URL: https://ogarev-online.ru/0030-400X/article/view/165599
- DOI: https://doi.org/10.1134/S0030400X1711011X
- ID: 165599
Cite item
Abstract
The retroreflection of optical radiation from surfaces with roughness in the form of ellipsoidal pores and two-level roughness in the form of convex ellipsoids with elliptical-porous surfaces is studied using the ROKS-RG Monte-Carlo method software in the geometrical-optics approximation. The dependence of the retroreflection phase function on the parameters of bodies that simulates the rough surface is analyzed. It is shown that the angular dependence of the retroreflection from porous rough surfaces with arbitrarily oriented pores and the aspect ratio higher than unity is a pronounced peak with concave sides at all incidence angles.
About the authors
E. V. Klass
Mendeleev Central Research Institute of Chemistry and Mechanics
Author for correspondence.
Email: elenaklass@yandex.ru
Russian Federation, Moscow, 115487
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