A silicon sublimation source for molecular-beam epitaxy


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详细

A sublimation source for molecular-beam epitaxy of silicon layers with a rectangular wafer of doped Si is described. The wafer is attached to springing molybdenum clamps with a smaller width of the contact pad than the wafer width, thus providing the possibility of the evaporation of Si atoms with a high flux density. The criteria for choosing the geometry of the contact pads, on which the silicon wafer–source is fixed, are presented.

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V. Shengurov

Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures

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Email: shengurov@phys.unn.ru
俄罗斯联邦, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680

S. Denisov

Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures

Email: shengurov@phys.unn.ru
俄罗斯联邦, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680

V. Chalkov

Lobachevskii Nizhny Novgorod State University

Email: shengurov@phys.unn.ru
俄罗斯联邦, pr. Gagarina 23, Nizhny Novgorod, 603950

D. Shengurov

Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures

Email: shengurov@phys.unn.ru
俄罗斯联邦, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680

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