A silicon sublimation source for molecular-beam epitaxy
- 作者: Shengurov V.G.1,2, Denisov S.A.1,2, Chalkov V.Y.1, Shengurov D.V.1,2
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隶属关系:
- Lobachevskii Nizhny Novgorod State University
- Institute for Physics of Microstructures
- 期: 卷 59, 编号 3 (2016)
- 页面: 466-469
- 栏目: Laboratory Techniques
- URL: https://ogarev-online.ru/0020-4412/article/view/159120
- DOI: https://doi.org/10.1134/S0020441216020342
- ID: 159120
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详细
A sublimation source for molecular-beam epitaxy of silicon layers with a rectangular wafer of doped Si is described. The wafer is attached to springing molybdenum clamps with a smaller width of the contact pad than the wafer width, thus providing the possibility of the evaporation of Si atoms with a high flux density. The criteria for choosing the geometry of the contact pads, on which the silicon wafer–source is fixed, are presented.
作者简介
V. Shengurov
Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures
编辑信件的主要联系方式.
Email: shengurov@phys.unn.ru
俄罗斯联邦, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680
S. Denisov
Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures
Email: shengurov@phys.unn.ru
俄罗斯联邦, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680
V. Chalkov
Lobachevskii Nizhny Novgorod State University
Email: shengurov@phys.unn.ru
俄罗斯联邦, pr. Gagarina 23, Nizhny Novgorod, 603950
D. Shengurov
Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures
Email: shengurov@phys.unn.ru
俄罗斯联邦, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680
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