A silicon sublimation source for molecular-beam epitaxy


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Resumo

A sublimation source for molecular-beam epitaxy of silicon layers with a rectangular wafer of doped Si is described. The wafer is attached to springing molybdenum clamps with a smaller width of the contact pad than the wafer width, thus providing the possibility of the evaporation of Si atoms with a high flux density. The criteria for choosing the geometry of the contact pads, on which the silicon wafer–source is fixed, are presented.

Sobre autores

V. Shengurov

Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures

Autor responsável pela correspondência
Email: shengurov@phys.unn.ru
Rússia, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680

S. Denisov

Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures

Email: shengurov@phys.unn.ru
Rússia, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680

V. Chalkov

Lobachevskii Nizhny Novgorod State University

Email: shengurov@phys.unn.ru
Rússia, pr. Gagarina 23, Nizhny Novgorod, 603950

D. Shengurov

Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures

Email: shengurov@phys.unn.ru
Rússia, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680

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