A silicon sublimation source for molecular-beam epitaxy
- Autores: Shengurov V.G.1,2, Denisov S.A.1,2, Chalkov V.Y.1, Shengurov D.V.1,2
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Afiliações:
- Lobachevskii Nizhny Novgorod State University
- Institute for Physics of Microstructures
- Edição: Volume 59, Nº 3 (2016)
- Páginas: 466-469
- Seção: Laboratory Techniques
- URL: https://ogarev-online.ru/0020-4412/article/view/159120
- DOI: https://doi.org/10.1134/S0020441216020342
- ID: 159120
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Resumo
A sublimation source for molecular-beam epitaxy of silicon layers with a rectangular wafer of doped Si is described. The wafer is attached to springing molybdenum clamps with a smaller width of the contact pad than the wafer width, thus providing the possibility of the evaporation of Si atoms with a high flux density. The criteria for choosing the geometry of the contact pads, on which the silicon wafer–source is fixed, are presented.
Sobre autores
V. Shengurov
Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures
Autor responsável pela correspondência
Email: shengurov@phys.unn.ru
Rússia, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680
S. Denisov
Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures
Email: shengurov@phys.unn.ru
Rússia, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680
V. Chalkov
Lobachevskii Nizhny Novgorod State University
Email: shengurov@phys.unn.ru
Rússia, pr. Gagarina 23, Nizhny Novgorod, 603950
D. Shengurov
Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures
Email: shengurov@phys.unn.ru
Rússia, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680
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