A silicon sublimation source for molecular-beam epitaxy
- Авторы: Shengurov V.G.1,2, Denisov S.A.1,2, Chalkov V.Y.1, Shengurov D.V.1,2
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Учреждения:
- Lobachevskii Nizhny Novgorod State University
- Institute for Physics of Microstructures
- Выпуск: Том 59, № 3 (2016)
- Страницы: 466-469
- Раздел: Laboratory Techniques
- URL: https://ogarev-online.ru/0020-4412/article/view/159120
- DOI: https://doi.org/10.1134/S0020441216020342
- ID: 159120
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Аннотация
A sublimation source for molecular-beam epitaxy of silicon layers with a rectangular wafer of doped Si is described. The wafer is attached to springing molybdenum clamps with a smaller width of the contact pad than the wafer width, thus providing the possibility of the evaporation of Si atoms with a high flux density. The criteria for choosing the geometry of the contact pads, on which the silicon wafer–source is fixed, are presented.
Об авторах
V. Shengurov
Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures
Автор, ответственный за переписку.
Email: shengurov@phys.unn.ru
Россия, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680
S. Denisov
Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures
Email: shengurov@phys.unn.ru
Россия, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680
V. Chalkov
Lobachevskii Nizhny Novgorod State University
Email: shengurov@phys.unn.ru
Россия, pr. Gagarina 23, Nizhny Novgorod, 603950
D. Shengurov
Lobachevskii Nizhny Novgorod State University; Institute for Physics of Microstructures
Email: shengurov@phys.unn.ru
Россия, pr. Gagarina 23, Nizhny Novgorod, 603950; ul. Akademicheskaya 7, Afonino, Kstovskii raion, Nizhny Novgorod oblast, 607680
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