A Technique for Measuring the Resistance of an Electrical Breakdown Channel in Thin Dielectric Films
- 作者: Pakhotin V.A.1, Sudar N.T.2
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隶属关系:
- Ioffe Institute, Russian Academy of Sciences
- Peter the Great St. Petersburg Polytechnic University
- 期: 卷 62, 编号 3 (2019)
- 页面: 329-336
- 栏目: Electronics and Radio Engineering
- URL: https://ogarev-online.ru/0020-4412/article/view/160705
- DOI: https://doi.org/10.1134/S0020441219020222
- ID: 160705
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详细
A technique for measuring the rate of change in the breakdown-channel resistance and estimating the true amplitude and duration of the breakdown current was developed. This technique is based on the dependence of the amplitude and frequency of oscillations of the measured current on the channel resistance. The resistance of the breakdown channel and the breakdown current in a polymer dielectric film were determined.
作者简介
V. Pakhotin
Ioffe Institute, Russian Academy of Sciences
编辑信件的主要联系方式.
Email: v.pakhotin@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021
N. Sudar
Peter the Great St. Petersburg Polytechnic University
编辑信件的主要联系方式.
Email: sudar53@mail.ru
俄罗斯联邦, St. Petersburg, 195251
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