The Influence of the Voltage Rise Time on Transient Processes during Current Overload in Stabilized Second-Generation HTSC Wires
- 作者: Malginov V.A.1
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隶属关系:
- Lebedev Physical Institute, Russian Academy of Sciences
- 期: 卷 45, 编号 11 (2019)
- 页面: 1122-1126
- 栏目: Article
- URL: https://ogarev-online.ru/1063-7850/article/view/208481
- DOI: https://doi.org/10.1134/S1063785019110269
- ID: 208481
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详细
The effect of spontaneous reverse transition of a stabilized high-temperature superconductor (HTSC) tape from the normal to resistive state during rapid (jumplike) voltage application and alternating current overload has been observed. It is established for the first time that, at a stabilizing layer thickness above 13 μm, the main heat evolution takes place in the copper stabilizer and this heat is effectively removed to the refrigerant, which significantly decreases the HTSC layer’s overheating. This is accompanied by a drop in the resistance of the secondary resistive state and increase in the duration of its existence. These data allow using the observed effect to increase the time of current limitation and improving reliability of HTSC current limiters.
作者简介
V. Malginov
Lebedev Physical Institute, Russian Academy of Sciences
编辑信件的主要联系方式.
Email: malginovva@lebedev.ru
俄罗斯联邦, Moscow, 119991
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