Influence of neutron irradiation on etching of SiC in KOH
- Авторы: Mokhov E.N.1, Kazarova O.P.1, Soltamov V.A.1, Nagalyuk S.S.1
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Учреждения:
- Ioffe Institute
- Выпуск: Том 62, № 7 (2017)
- Страницы: 1119-1121
- Раздел: Experimental Instruments and Technique
- URL: https://ogarev-online.ru/1063-7842/article/view/199741
- DOI: https://doi.org/10.1134/S1063784217070143
- ID: 199741
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Аннотация
The effect of reactor neutron irradiation on the etch rate of SiC in potassium hydroxide has been studied. In the case of high irradiation doses (1019–1021 cm–2), the etch rate of silicon carbide has been shown to drastically rise, especially in the [0001]Si direction. This considerably mitigates the orientation anisotropy of polar face etching. After high-temperature annealing (up to 1200–1400°C), a higher etch rate of irradiated crystals persists. The results have been explained by the high concentration of radiation-induced (partially clustered) defects they contain.
Об авторах
E. Mokhov
Ioffe Institute
Автор, ответственный за переписку.
Email: mokhov@mail.ioffe.ru
Россия, Politekhnicheskaya ul. 26, St. Petersburg, 184021
O. Kazarova
Ioffe Institute
Email: mokhov@mail.ioffe.ru
Россия, Politekhnicheskaya ul. 26, St. Petersburg, 184021
V. Soltamov
Ioffe Institute
Email: mokhov@mail.ioffe.ru
Россия, Politekhnicheskaya ul. 26, St. Petersburg, 184021
S. Nagalyuk
Ioffe Institute
Email: mokhov@mail.ioffe.ru
Россия, Politekhnicheskaya ul. 26, St. Petersburg, 184021
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