Localization of the Wannier–Mott Exciton on a Langmuir-Film/CdS Organic Semiconductor Interface
- Autores: Korolkova K.A.1, Novak V.R.2, Sel’kin A.V.1,3
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Afiliações:
- Ioffe Institute
- NT-MDT Spectrum Instruments Ltd.
- St. Petersburg State University
- Edição: Volume 61, Nº 7 (2019)
- Páginas: 1304-1309
- Seção: Surface Physics and Thin Films
- URL: https://ogarev-online.ru/1063-7834/article/view/205953
- DOI: https://doi.org/10.1134/S1063783419070175
- ID: 205953
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Resumo
The low-temperature (T = 2 K) light reflectance spectra of organic semiconductor structures produced by depositing Langmuir–Blodgett films on a cadmium sulfide (CdS) crystal surface are studied. The spectra were studied in the region of the resonant frequency of the exciton state An = 1 in CdS. The spectra were analyzed within a multilayer medium model with allowance for the spatial dispersion and an exciton-free “dead” layer near the crystal surface contacting with the film. A conclusion is made that, as a result of the deposition of an organic film on a semiconductor crystal surface, the Wanier–Mott exciton is spatially localized near the film–crystal interface.
Sobre autores
K. Korolkova
Ioffe Institute
Autor responsável pela correspondência
Email: ksenia.korolikova@gmail.com
Rússia, St. Petersburg, 194021
V. Novak
NT-MDT Spectrum Instruments Ltd.
Email: ksenia.korolikova@gmail.com
Rússia, Moscow, 124460
A. Sel’kin
Ioffe Institute; St. Petersburg State University
Email: ksenia.korolikova@gmail.com
Rússia, St. Petersburg, 194021; St. Petersburg, 199034
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