Localization of the Wannier–Mott Exciton on a Langmuir-Film/CdS Organic Semiconductor Interface


Citar

Texto integral

Acesso aberto Acesso aberto
Acesso é fechado Acesso está concedido
Acesso é fechado Somente assinantes

Resumo

The low-temperature (T = 2 K) light reflectance spectra of organic semiconductor structures produced by depositing Langmuir–Blodgett films on a cadmium sulfide (CdS) crystal surface are studied. The spectra were studied in the region of the resonant frequency of the exciton state An = 1 in CdS. The spectra were analyzed within a multilayer medium model with allowance for the spatial dispersion and an exciton-free “dead” layer near the crystal surface contacting with the film. A conclusion is made that, as a result of the deposition of an organic film on a semiconductor crystal surface, the Wanier–Mott exciton is spatially localized near the film–crystal interface.

Sobre autores

K. Korolkova

Ioffe Institute

Autor responsável pela correspondência
Email: ksenia.korolikova@gmail.com
Rússia, St. Petersburg, 194021

V. Novak

NT-MDT Spectrum Instruments Ltd.

Email: ksenia.korolikova@gmail.com
Rússia, Moscow, 124460

A. Sel’kin

Ioffe Institute; St. Petersburg State University

Email: ksenia.korolikova@gmail.com
Rússia, St. Petersburg, 194021; St. Petersburg, 199034

Arquivos suplementares

Arquivos suplementares
Ação
1. JATS XML

Declaração de direitos autorais © Pleiades Publishing, Ltd., 2019