Emission Kinetics of Surface (Bi)Excitons in ZnO Thin Films
- Авторлар: Akopyan I.K.1, Labzovskaya M.E.1, Novikov B.V.1, Talalaev V.G.2, Tomm J.W.3, Schilling J.2
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Мекемелер:
- St. Petersburg State University
- Martin-Luther University, Centre for Innovation Competence SiLi-nano
- Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy
- Шығарылым: Том 61, № 3 (2019)
- Беттер: 402-407
- Бөлім: Optical Properties
- URL: https://ogarev-online.ru/1063-7834/article/view/205041
- DOI: https://doi.org/10.1134/S1063783419030041
- ID: 205041
Дәйексөз келтіру
Аннотация
The kinetics of near-edge photoluminescence (PL) in ZnO nanofilms prepared by the atomic layer deposition has been investigated. It is established that the kinetics of near-edge PL in 4-nm films is determined to a great extent by surface 2D-exciton (SX) and biexciton (SXX) complexes. The contribution from surface biexcitons is estimated based on a photostimulated change in the surface potential in ZnO films with different thicknesses. Ultrafast dynamics of surface biexcitons in thin films are revealed. It is shown that biexcitons localized near the surface have the shortest radiative lifetime (less than 100 ps) among all bound exciton complexes, which is explained by the large oscillator strength.
Авторлар туралы
I. Akopyan
St. Petersburg State University
Email: xrul@mail.ru
Ресей, St. Petersburg, 199034
M. Labzovskaya
St. Petersburg State University
Хат алмасуға жауапты Автор.
Email: xrul@mail.ru
Ресей, St. Petersburg, 199034
B. Novikov
St. Petersburg State University
Email: xrul@mail.ru
Ресей, St. Petersburg, 199034
V. Talalaev
Martin-Luther University, Centre for Innovation Competence SiLi-nano
Email: xrul@mail.ru
Германия, Halle
J. Tomm
Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy
Email: xrul@mail.ru
Германия, Berlin
J. Schilling
Martin-Luther University, Centre for Innovation Competence SiLi-nano
Email: xrul@mail.ru
Германия, Halle
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