Transfilm passivation of a silicon–ytterbium nanofilms interface with chemisorbed CO and O2 molecules
- Авторлар: Mittsev M.A.1, Kuz’min M.V.1, Blashenkov N.M.1
-
Мекемелер:
- Ioffe Institute
- Шығарылым: Том 59, № 8 (2017)
- Беттер: 1637-1642
- Бөлім: Surface Physics and Thin Films
- URL: https://ogarev-online.ru/1063-7834/article/view/200797
- DOI: https://doi.org/10.1134/S1063783417080169
- ID: 200797
Дәйексөз келтіру
Аннотация
Passivation of a silicon–ytterbium nanofilm interface with СО and О2 molecules chemisorbed on the opposite side of films is studied. The transfilm inhibition of silicides is found to be caused by the Coulomb interactions between the localized electrons forming the donor–acceptor bonding of molecules with films and the conductivity electrons of ytterbium (6s-band). This interaction increases the energy of the chemisorbed molecules–ytterbium films system. At a given amount of chemisorbed molecules this increase is higher for the thinner rather than thicker films. This correlation with the film thickness favors the lack of chemical interaction between silicon and ytterbium, when СО and О2 molecules are chemisorbed on the nanofilm surface.
Авторлар туралы
M. Mittsev
Ioffe Institute
Хат алмасуға жауапты Автор.
Email: M.Mittsev@mail.ioffe.ru
Ресей, St. Petersburg
M. Kuz’min
Ioffe Institute
Email: M.Mittsev@mail.ioffe.ru
Ресей, St. Petersburg
N. Blashenkov
Ioffe Institute
Email: M.Mittsev@mail.ioffe.ru
Ресей, St. Petersburg
Қосымша файлдар
