Автор туралы ақпарат
Nussupov, K. Kh.
| Шығарылым | Бөлім | Атауы | Файл |
| Том 59, № 5 (2017) | Surface Physics, Thin Films | X-ray reflectometry and simulation of the parameters of SiC epitaxial films on Si(111), grown by the atomic substitution method | |
| Том 61, № 12 (2019) | Surface Physics and Thin Films | Low-Temperature Synthesis of α-SiC Nanocrystals |