Author Details
Bakranova, D. I.
| Issue | Section | Title | File |
| Vol 59, No 5 (2017) | Surface Physics, Thin Films | X-ray reflectometry and simulation of the parameters of SiC epitaxial films on Si(111), grown by the atomic substitution method | |
| Vol 61, No 12 (2019) | Surface Physics and Thin Films | Low-Temperature Synthesis of α-SiC Nanocrystals |