Use of Special Devices for X-Ray Interferometric Investigation of Structural Imperfections in Single Crystals

H. R. Drmeyan; Дрмеян Г. Р.; M. S. Vasilyan; Василян М. С.

doi:10.31857/S1028096023090030

Use of Special Devices for X-Ray Interferometric Investigation of Structural Imperfections in Single Crystals

Authors: Drmeyan H.R.¹^,2, Vasilyan M.S.¹
Affiliations:
1. Institute of Applied Problems of Physics of the National Academy of Science of the Republic of Armenia
2. Shirak State University after M. Nalbandyan
Issue: No 9 (2023)
Pages: 96-102
Section: Articles
URL: https://ogarev-online.ru/1028-0960/article/view/137818
DOI: https://doi.org/10.31857/S1028096023090030
EDN: https://elibrary.ru/ZLSYPX
ID: 137818

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Abstract
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Abstract

A universal device for X-ray interferometric study of structural defects in single crystals has been designed, manufactured and tested. The device can serve both for scratching the surface of the interferometer crystal blocks and for bending it. A technology for generating dislocation in an interferometer block is also proposed. It has been experimentally proved that the moiré topographic patterns obtained using a double X-ray interferometer depend on the orientation of the reflection planes relative to the defect (dislocation). It is shown that multiple interferometers make it possible to simultaneously observe images of various structural imperfections. The results obtained make it possible to judge the spatial orientation of defects and the distribution of strain fields caused by these defects, i.e., strain fields can be visualized as X-ray moiré patterns. The results obtained in the work can form the basis for solving the inverse task, namely, the restoration of mechanical tension fields in the interferometer crystal blocks using the decoding of moiré patterns.

Keywords

multiple interferometers, moiré topogram, crystal block bending, structural defects, scratch, dislocation generation, strain field.

About the authors

H. R. Drmeyan

Institute of Applied Problems of Physics of the National Academy of Science of the Republic of Armenia; Shirak State University after M. Nalbandyan

Author for correspondence.
Email: drm-henrik@mail.ru
Republic of Armenia, 0014, Yerevan; Republic of Armenia, 3126, Shirak Marz, Gyumri

M. S. Vasilyan

Institute of Applied Problems of Physics of the National Academy of Science of the Republic of Armenia

Email: drm-henrik@mail.ru
Republic of Armenia, 0014, Yerevan

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