Special boundaries in secondary recrystallization

Abstract

In polycrystalline Fe–3% Si alloy, various stages in low-temperature anomalous grain growth are investigated by electron backscatter diffraction (EBSD). For all the samples, the magnetic induction is relatively low: B₈₀₀ = 1.62–1.72 T; that corresponds to deviation of the easy-magnetization axis [001] of the crystallites from the rolling direction by 12°–20°. The secondary-recrystallization texture is described by the orientations {110}<115>. The small grains between the anomalously growing crystallites (the secondary-recrystallization matrix) are characterized by strongly scattered (almost axial) texture {hkl}<001>. The orientation of the growing grains is close to disorientation Σ5 in most of the crystallites forming the absorbed matrix. The anomalously growing grains ultimately absorb crystallites with special boundaries Σ3 or Σ17b.