Influence of the molar ratio Sr:Bi:Ta in bismuth-strontium tantalum films SryBi2+xTa2O9 on structure and electrophysical properties

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Abstract

Polycrystalline thin films of bismuth-strontium tantalum SryBi2+xTa2O9 with different molar ratio Sr:Bi:Ta were obtained by sol-gel method. The formation of a phase with a perovskite structure has been established. Phase transitions have been confirmed by dielectric spectroscopy. In the mode of polarization switching spectroscopy, remnant piezoelectric hysteresis loops were obtained, which confirms the ferroelectric nature of the synthesized SryBi2+xTa2O9 films.

About the authors

D. A. Kiselev

Kotel’nikov Institute of Radio Engineering and Electronics (Fryazino Branch), Russian Academy of Sciences; National University of Science and Technology “MISIS”

Email: gvc@ms.ire.rssi.ru
Russian Federation, Fryazino, 141190; Moscow, 119049

E. A. Kurteva

National University of Science and Technology “MISIS”

Email: gvc@ms.ire.rssi.ru
Russian Federation, Moscow, 119049

A. V. Semchenko

F. Skorina Gomel State University

Email: gvc@ms.ire.rssi.ru
Belarus, Gomel, 246028

A. A. Boiko

Sukhoi State Technical University of Gomel

Email: gvc@ms.ire.rssi.ru
Belarus, Gomel, 246746

L. V. Sudnik

Powder Metallurgy Institute, Research Institute of Impulse Processes with Pilot Production

Email: gvc@ms.ire.rssi.ru
Russian Federation, Minsk, 220034

G. V. Chucheva

Kotel’nikov Institute of Radio Engineering and Electronics (Fryazino Branch), Russian Academy of Sciences

Author for correspondence.
Email: gvc@ms.ire.rssi.ru
Russian Federation, Fryazino, 141190

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